Fundamentals of forensic science / Max M. Houck, Jay A. Siegel,

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Publication details: Elsevier, Academic Press, Academic Press is an imprint of Elsevier, 2015 Amsterdam ; Boston :Edition: 3rd edDescription: xxxi, 703 p. : ill. (some color) ; 25 cmISBN:

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Holdings
Current library	Collection	Call number	Copy number	Status	Barcode
Nairobi Campus General Circulation	Non-fiction	HV8073 .H77 2015 (Browse shelf(Opens below))	1	Available	054792
Nairobi Campus General Circulation	Non-fiction	HV8073 .H77 2015 (Browse shelf(Opens below))	2	Available	054793

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Includes bibliographical references and index.

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